Spitzer Microlens Measurement of a Massive Remnant in a Well-separated Binary
| Title | Spitzer Microlens Measurement of a Massive Remnant in a Well-separated Binary |
| Publication Type | Journal Article |
| Authors | Shvartzvald, Y, Udalski, A, Gould, A, Han, C, Bozza, V, Friedmann, M, Hundertmark, M, , , Beichman, C, Bryden, G, S. Novati, C, Carey, S, Fausnaugh, M, Gaudi, B S, Henderson, C B, Kerr, T, Pogge, R W, Varricatt, W, Wibking, B, Yee, J C, Zhu, W, Team, S, Poleski, R, Pawlak, M, Szymański, M K, Skowron, J, Mróz, P, Kozłowski, S, Wyrzykowski, Ł, Pietrukowicz, P, Pietrzyński, G, Soszyński, I, Ulaczyk, K, Group, OGLE, Choi, J-Y, Park, H, Jung, Y K, Shin, I-G, Albrow, M D, Park, B-G, Kim, S-L, Lee, C-U, Cha, S-M, Kim, D-J, Lee, Y, Group, KMTN, Maoz, D, Kaspi, S, Group, W, Street, R A, Tsapras, Y, Bachelet, E, Dominik, M, Bramich, D M, Horne, K, Snodgrass, C, Steele, I A, Menzies, J, R. Jaimes, F, Wambsganss, J, Schmidt, R, Cassan, A, Ranc, C, Mao, S, Dong, S, , , D'Ago, G, Scarpetta, G, Verma, P, Jørgensen, U G, Kerins, E, Skottfelt, J, , |
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